Si-PIN detectors represent a crucial technology in the realm of radiation detection, particularly for applications involving X-ray Fluorescence (XRF) and X-ray Diffractometer (XRD) systems. These detectors, based on silicon PIN (p-type, intrinsic, n-type) diode technology, offer excellent energy resolution, stability, and sensitivity, making them indispensable for precise analytical instrumentation. At 核芯光电科技（山东）有限公司, we proudly develop and manufacture advanced Si-PIN detectors, including our flagship PA350 and PA200 models, designed to meet the rigorous demands of modern scientific and industrial applications.

Si-PIN detectors utilize a silicon-based semiconductor structure that allows for efficient detection of ionizing radiation, particularly X-rays. The intrinsic layer between the p-type and n-type silicon regions creates a sensitive volume where incoming photons generate electron-hole pairs. This process produces an electrical signal proportional to the energy of the detected radiation. Compared to other detector types, Si-PIN detectors boast superior energy resolution and faster response times, making them ideal for spectroscopic applications. Their compact size and robust design further contribute to their widespread use in analytical instruments.

In the context of XRF and XRD systems, Si-PIN detectors serve as the core sensing elements that convert X-ray photons into electrical signals for material composition analysis and crystal structure investigation respectively. The precise energy discrimination capabilities of Si-PIN detectors enable accurate identification of elemental signatures and diffraction patterns, which are critical for research and quality control processes across various industries.

核芯光电科技（山东）有限公司 has developed two high-performance Si-PIN detector models: the PA350 and the PA200. These detectors are engineered with state-of-the-art semiconductor fabrication techniques and optimized for excellent energy resolution and stability under diverse operating conditions. The PA350 model features a larger active area, enhancing sensitivity for low-intensity X-ray signals, while the PA200 offers a compact form factor suitable for space-constrained applications without compromising performance.

Both models incorporate advanced cooling mechanisms and low-noise preamplifier designs, delivering superior signal-to-noise ratios essential for high-precision measurements. Their rugged construction ensures long-term reliability and minimal maintenance, even in demanding industrial environments. These detectors are compatible with a wide range of spectrometer systems and are easily integrated into existing analytical setups.

XRF analysis relies heavily on the sensitivity and resolution of detectors to accurately quantify elemental composition in materials. Our Si-PIN detectors, particularly the PA350 and PA200, excel in this application by providing sharp energy peaks and low background noise. This allows for detection of trace elements with high confidence and improved analytical throughput.

Industries such as mining, environmental monitoring, and manufacturing benefit from the deployment of Si-PIN detectors in portable and benchtop XRF analyzers. These detectors enable rapid, non-destructive testing of metals, soils, and liquids, facilitating real-time decision-making and quality assurance. The robust performance of our detectors ensures consistent results across varied sample types and measurement conditions.

In XRD systems, Si-PIN detectors like the PA350 and PA200 play a pivotal role in detecting diffracted X-rays to analyze crystal structures. Their excellent energy resolution helps differentiate between closely spaced diffraction peaks, enabling detailed characterization of complex materials. This capability is vital in fields such as materials science, pharmaceuticals, and nanotechnology, where precise structural information is essential.

Our detectors support high-speed data acquisition and maintain performance stability during prolonged measurements, addressing the needs of both research laboratories and industrial production lines. The PA200’s compact design is especially valued in customized XRD instruments where space and weight are critical factors.

Si-PIN detectors offer several advantages that make them the preferred choice for XRF and XRD applications. Their high energy resolution enables accurate spectral analysis, essential for identifying elemental and structural information with precision. The detectors’ low leakage current and noise contribute to improved signal clarity, enhancing detection limits.

Moreover, Si-PIN detectors provide fast response times and stable operation over a wide temperature range, reducing the need for frequent recalibration. Their compact and durable design facilitates integration into diverse instrumentation environments, from portable analyzers to large-scale laboratory systems.

Our self-developed PA350 and PA200 models embody these strengths, delivering reliable performance that supports critical analytical workflows. Choosing these detectors ensures enhanced measurement accuracy, operational efficiency, and long-term cost savings.

The PA350 Si-PIN detector features an active area of approximately 350 mm², with an energy resolution typically around 140 eV at 5.9 keV, and operates efficiently within a temperature range of -20°C to +50°C. The PA200, with a 200 mm² active area, offers comparable resolution performance and is designed for compact integration requirements.

Both models incorporate low capacitance designs and high-purity silicon material, contributing to reduced electronic noise and improved detection sensitivity. The detectors include hermetically sealed housings to prevent contamination and ensure long-term stability. Detailed datasheets and configuration options are available on our PRODUCTS page.

Proper installation and handling of Si-PIN detectors are critical to achieving optimal performance. We recommend mounting the detectors in clean, dust-free environments and ensuring electrical connections are secure and shielded from electromagnetic interference. Cooling systems should be checked regularly to maintain stable detector temperatures and prevent thermal noise.

核芯光电科技（山东）有限公司 provides comprehensive installation manuals and technical support to assist customers in integrating our PA350 and PA200 detectors into their systems. Users are encouraged to follow recommended calibration procedures and perform routine maintenance to extend detector lifespan and measurement accuracy.

Our Si-PIN detectors have been successfully deployed in numerous industrial and research applications worldwide. Clients in the mining sector report improved elemental analysis accuracy with our PA350 detector, facilitating better resource assessment and extraction strategies. Pharmaceutical companies utilizing the PA200 model benefit from its compact design and reliable detection capabilities for polymorph identification in drug development.

Case studies detailing these applications, including performance metrics and user feedback, are available to prospective customers. These testimonials highlight the superior quality and durability of our detectors, reflecting 核芯光电科技（山东）有限公司’s commitment to innovation and customer satisfaction. For more insights, please visit our ABOUT US page.

In summary, the PA350 and PA200 Si-PIN detectors from 核芯光电科技（山东）有限公司 represent a pinnacle of performance and reliability for XRF and XRD applications. Their advanced design, excellent energy resolution, and robust build quality make them ideal for diverse analytical challenges. We invite you to explore how these detectors can enhance your analytical capabilities and support your business goals.

For further information, product inquiries, or technical support, please visit our CONTACT US page or browse our extensive product catalog on the PRODUCTS page. Partner with 核芯光电科技（山东）有限公司 for cutting-edge Si-PIN detector solutions tailored to your needs.